Uvod: elektronska struktura, magnetne lastnosti, simetrije v trdni snovi, interakcija svetloba-snov, interakcija elektroni-snov, osnove elektronske optike, nastanek slike v SEM in TEM.
Spektroskopske tehnike: infrardeča spektroskopija, meritve reflektivnosti, infrardeča spektroskopija fononov, Fourier transform spektroskopija, elipsometrija, Ramanovo in Reyleighovo sipanje, ultrahitre časovno-ločljive tehnike, jedrska magnetna resonanca, elektronska spinska resonanca, mionska spinska rotacija, nevtronsko sipanje (elastično in neelastično).
Mikroskopske tehnike: vrstična elektronska
mikroskopija (SEM), presevna elektronska
mikroskopija (TEM, CTEM, HRTEM), elektronska
difrakcija (SAD, mikrodifrakcija), vrstična presevna
elektronska mikroskopija (STEM, HAADF-STEM),
energijsko-disperzijska spektroskopija rentgenskih žarkov (EDXS), tipalna mikroskopija (SPM), vrstična tunelska mikroskopija (STM ) in mikroskopija na atomsko silo (AFM).
Introduction: Electronic structure, Magnetic properties, Symmetry in solids, Light-matter interaction, Electron-matter interaction, Electron optics, Image formation in SEM and in TEM.
Spectroscopic techniques: Spectroscopy in the Infrared, Reflectivity measurements, Infrared Spectroscopy of Phonons, Fourier Transform Spectroscopy, Ellipsometry, Raman and Reyleigh Scattering, Ultrafast real-time techniques, Nuclear Magnetic Resonance, Electron Spin Resonance, Muon-Spin-Rotation, Neutron Scattering (elastic and inelastic).
Microscopic techniques: Scanning electron
microscopy (SEM), Transmission electron
microscopy (TEM, CTEM, HRTEM), Electron
diffraction (SAD, micro-diffraction), Scanning
transmission electron microscopy (STEM, HAADFSTEM), energy-dispersive X-ray spectroscopy (EDX), Scanning probe microscopy (SPM), Scanning tunnelling microscopy (STM), atomic force microscopy (AFM).